WaveMaster® Compact Universal - Wavefront and Surface Measurements with Shack-Hartmann Sensors
The WaveMaster® COMPACT Universal measures lenses in both transmission and reflection with TRIOPTICS' Shack-Hartmann sensor. It is possible to measure the wavefront and surface topography of plano, spherical and aspherical optics with one measurement system by making simple adjustments.
Key Features
- One measurement instrument for the measurement of the wavefront and surface topography
- High measurement speed enables high sample throughput
- Fast and easy adaptable to different sample types
- High precision four axes alignment sample holder for submicron position adjustment
- Only minimum amount of sample alignment necessary when measuring series of samples
- Real time comparison with wavefront data from master lenses or design files
- High accuracy
- Automatic focusing
- The automatic positioning of the wavefront sensor and the telescope in the exit pupil
- Point light source with different numerical apertures available (up to 0.95)
- Vibration insensitive
- Comprehensive software for the wavefront and surface measurement with Shack-Hartmann Sensor
Applications
The WaveMaster® Compact Universal uses its built-in Shack-Hartmann sensor to determine the following parameters:
- Measurement of the wavefront (PV, RMS) and surface topography
- Determination of the Zernike coefficients
- Measurement of the Point Spread Function (PSF)
- Measurement of the Modulation Transfer Function (MTF)
- Measurement of the Strehl ratio
- Wedge angle
- Measuring the surface topography of aspherical lenses, spheres and plane surfaces
- Radius measurement
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