WaveMaster®
The WaveMaster® smartgage
is the ideal metrology
solution for monitoring
and controlling production
processes of small optical
components. Camera lenses
of cell phones and digital
cameras are common
examples. The metrology
instrument allows pass/fail
analysis of digital surface
deviation measurements
on spherical, flat and
aspheric components in
just a second.
The standalone instrument represents
innovative technology to
achieve highest quality
management levels in
production areas.
| System |
| Measurement Tasks |
Spherical surface in reflection
Flat surface in reflection
Relative radius of curvature measurement (optional) |
| Measurement Wavelength |
635nm |
| Exit Beam Diameter |
25.4nm |
| Measurement Time incl. Analysis |
≤ 1 s |
| Travel Range of Sample Holder |
Z-Stage: travel range = 80mm
X-Stage: travel range = 2mm
Y-Stage: travel range = 2mm
|
| Light Intensity |
Manually adjustable <1mW |
| Mechanical Interface |
standard mount for Spherical Objectives |
| Working Position |
Tabletop unit
|
| Dimensions |
| Dimensions (W x D x H) |
220mm x 275mm x 205mm |
| Weight |
4.5kg |
| Versions |
| |
Basic |
Standard |
Advanced |
| PV, RMS, ISO Coefficients |
+ |
+ |
+ |
| PASS / FAIL Indication |
- |
+ |
+ |
| Graphical Data Display |
2D |
2D |
1D,2D |
| Relative ROC Measurement |
- |
- |
+ |
| Storage of Numerical Measurement Results |
- |
+ |
+ |
| Measurement Data Protocol Generator |
- |
- |
+ |
| Use of customized Templates |
- |
- |
+ |
| USB Interface |
+ |
+ |
+ |
| Upgrade, Update |
+ |
+ |
+ |
| System Performance |
| PV Repeatability 1 |
λ/100 (λ@635nm) |
| RMS Repeatability 2 |
λ/500 (λ@635nm) |
| Measurement Accuracy 3 |
λ/10 (λ@635nm) |
| Relative Radius Measurement Accuracy in Percent of absolute Radius |
5 x R -1.5 % (R = mm) |
| Laser Specifications |
| Type |
Integrated Diode Laser |
| Laser Protection Class |
2 |
| Wavelength |
635 nm |
| Output Power at Aperture |
< 1mW |
Notations:
1 Measured PV-Repeatability of the quoted statistic is for 100 consecutive measurements of the same cavity, measured over 96%
clear aperture. The specification represents the 2σ value of each statistic
2 Measured RMS-Repeatability of the quoted statistic is for 100 consecutive measurements of the same cavity, measured over 96%
clear aperture. The specification represents the 2σ value of each statistic.
3 The measurement uncertainty equals the surface accuracy of the calibration surface used for the interferometer calibration up to
the specified value. TRIOPTICS supplies standard calibration surfaces with a certified accuracy of λ/20 (surface shape deformation).
Higher qualities on request.
All measurements were performed on a isolated optical table
|
Products > WaveSensor® & WaveMaster® > Specifications > WaveMaster® Smartgage
