WaveMaster® Compact Reflex - Surface Topography Measurements of Single Lenses with Shack-Hartmann Sensors

WaveMaster® Compact Reflex
WaveMaster® Compact Reflex

Optimized for ease-of-use and flexibility, the WaveMaster® COMPACT Reflex measures surface profiles using a Shack-Hartmann sensor in reflection.

Key Features

  • Fast measurement of surface profiles with Shack-Hartmann sensors
  • Fast and easy adaptable to different sample types
  • High measurement speed enables high sample throughput
  • High precision four axes alignment sample holder for submicron position adjustment.
  • Alignment compensation: Only minimum amount of sample alignment necessary when measuring series of samples
  • Automatic focusing
  • The automatic positioning of the wavefront sensor and the telescope in the exit pupil
  • Real time comparison with wavefront data from master lenses or design files
  • Point light source with different numerical apertures available (up to 0.95)
  • Vibration insensitive
  • Comprehensive software for the measurement and analysis of surfaces with Shack-Hartmann sensors

Applications

Surface measurement in reflection with a Shack-Hartmann sensor
Surface measurement in reflection with a Shack-Hartmann sensor

The WaveMaster® Compact Reflex can be used for the following applications:

  • Measuring the surface topography of aspherical lenses, spheres and plane surfaces
  • Radius measurement