µShape™ Generic Package

The most advanced software solution for most static or phase-shifting commercial and custom-built interferometers. The µShape™ Generic Package solves a wide range of measurement tasks and specifications at an unbeatable price. In addition to its extended range of features, the µShape™ Generic Package offers you additional functions in the form of add-on modules. These modules allow your software to be individually adapted to your specific measuring requirements. Add-on modules can be freely combined and can be installed with the original software or separately at a later point in time.

The µShape™ Generic Package includes a licence for µShape™ Professional, control for your camera (e.g. USB or frame grabber) and, if required, control for phase shifter. The package is installed on site. Additional hardware (e.g. phase shifter, PC or camera) are available upon request.

Features

• Phase-shifting interference pattern analysis
• Phase step evaluation for every measurement
• Selection of hardware parameters (e.g. test lens, adjustment type)
• Various evaluation parameters (sign, smoothing, grazing incidence option...)
• Permanent live camera image, full screen mode
• Cropping of the camera image to the area of interest
• Calculation of Zernike and Seidel coefficients
• Masks, coupling of different masks, display of mask contours in the camera image window, full screen mode for setting masks.
• Automatic pupil detection
• Automatic and manual scaling
• DIN 3140 / ISO 10110 calculations of single and multiple apertures
• Computation of slope field (horizontal / vertical / absolute)
• Radius measurement (relative and absolute)
• Determination of reference points
• Export of data fields (binary, ASCII, INT, Zernike)
• Export of results parameters (defined selection)
• Export of windows as bitmaps P
• rinting of single windows or screen print possible
• Pre-configurable with templates
• Four different user levels to simplify workshop use
• Software access protection with a dongle
• Upgradeable

Add-on modules

• Aspheres
• Cylinders
• External interface
• Fast Fringe
• Fiber connector
• Homogeneity
• MTF / PSF
• Multiple apertures
• Multiple statistics
• Prisms (incl. corner cuves, 90° prisms, and wedges)
• PSD / Roughness
• Sample normal data
• Tool offset
• Torus
• Wafer analysis